Events
Knight Auto Expands Service Capabilities to Support the Medical Industry
Knight Auto is pleased to announce an expansion of our service capabilities to better support…
Events
Upcoming Events

Medical Industry
Ensuring Accuracy And Reliability of Diagnostic And Patient Care Devices
End-use Environments

Diagnostic Imaging Systems
Chips must remain stable under continuous operation and precise timing control.

Patient Monitoring Devices
Accuracy and uptime are critical for wearables and bedside equipment.

Implantable & Wearable Tech
Requires endurance against thermal variation, signal drift, and miniaturization constraints.

Laboratory & Surgical Equipment
Demands performance under variable conditions with zero margin for error.
Knight Auto Expands Service Capabilities to Support the Medical Industry
Knight Auto is pleased to announce an expansion of our service capabilities to better support…
- Probe Card Stiffeners & Frames
Maintain flatness and structural integrity during wafer-level contact to improve test yield. - Inlays & Support Structures
Reinforce probe heads and cards to reduce warping and misalignment. - Interface Hardware for Probe Integration
Components that align and secure probe systems to wafer testers. - Docking & Alignment Fixtures
Enable repeatable, accurate connection between probe assemblies and test equipment. - Tooling for Wafer-Level Test Platforms
Mechanical systems designed to support reliable wafer probing and fixture integration.
Probe Card Adapters

Enable seamless integration between different probe card formats and handler platforms with consistent mechanical fit.
- Designed for multi-vendor compatibility
- Reduces alignment variation across setups
- Customizable for socket or prober-specific mounts
Find out more ⟶
1
2
Parallax Section by bPlugins
The Parallax effect is a modern web design technique where the background element scrolls slower than the foreground content. The parallax effect can be used on landing pages, long-form content, sales pages, or the homepage of a business website. It is a great way to highlight different sections on a lengthy page.
Solutions
Building Solutions for Semiconductor Value Chain
Knight Auto delivers engineered systems that support the full semiconductor lifecycle. From probing and test to monitoring and final output, our solutions ensure quality, consistency, and reliability where it matters most.
Champion Manufacturing
Champion expands Knight Auto’s chip probing offerings through its advanced manufacturing capabilities for precision probe cards, burn-in sockets, sampling tools and custom fixtures for accurate and reliable wafer testing.
Back-End Semiconductor Solutions

Knight Auto
Knight Auto designs and fabricates precision tooling and testing systems for vital semiconductor back-end processes, from ball attach to final test, ensuring performance at high throughput in large-scale industrialization settings.
Solutions Overview
Our Solutions
Chip Probe Semiconductor Solutions

Champion Manufacturing
Champion expands Knight Auto’s chip probing offerings through its advanced manufacturing capabilities for precision probe cards, burn-in sockets, sampling tools and custom fixtures for accurate and reliable wafer testing.
Back-End Semiconductor Solutions

Knight Auto
Knight Auto designs and fabricates precision tooling and testing systems for vital semiconductor back-end processes, from ball attach to final test, ensuring performance at high throughput in large-scale industrialization settings.
Other Industries

Medical
Other Industries
Other Industries
Medical
CNC
Chip Probe Semiconductor Solutions

Champion Manufacturing
Champion expands Knight Auto’s chip probing offerings through its advanced manufacturing capabilities for precision probe cards, burn-in sockets, sampling tools and custom fixtures for accurate and reliable wafer testing.
Back-End Semiconductor Solutions

Knight Auto
Knight Auto designs and fabricates precision tooling and testing systems for vital semiconductor back-end processes, from ball attach to final test, ensuring performance at high throughput in large-scale industrialization settings.
Chip Probe Semiconductor Solutions

Champion Manufacturing
Champion expands Knight Auto’s chip probing offerings through its advanced manufacturing capabilities for precision probe cards, burn-in sockets, sampling tools and custom fixtures for accurate and reliable wafer testing.
Back-End Semiconductor Solutions

Knight Auto
Knight Auto designs and fabricates precision tooling and testing systems for vital semiconductor back-end processes, from ball attach to final test, ensuring performance at high throughput in large-scale industrialization settings.
Stiffeners
Our Products
Samples
Our Technology and Engineering Services
Wafer Probe & Test Solutions
Tailored engineering support for wafer-level precision
- Prototyping & Feasibility Studies
Validate early-stage mechanical concepts for probe card stability and handler compatibility. - Inlays & Support Structures
Reinforce probe heads and cards to reduce warping and misalignment. - Interface Hardware for Probe Integration
Components that align and secure probe systems to wafer testers. - Docking & Alignment Fixtures
Enable repeatable, accurate connection between probe assemblies and test equipment. - Tooling for Wafer-Level Test Platforms
Mechanical systems designed to support reliable wafer probing and fixture integration.
Wafer Probe & Test Solutions
Related Products
Wafer Probe Interface Plate

Provides a stable mechanical interface between the probe card and wafer prober to ensure flat, repeatable contact alignment.
- Optimized for co-planarity and rigidity
- Supports high pin-count, fine-pitch probing
- Machined to tight dimensional tolerances
Find out more ⟶
Probe Card Adapters

Enable seamless integration between different probe card formats and handler platforms with consistent mechanical fit.
- Designed for multi-vendor compatibility
- Reduces alignment variation across setups
- Customizable for socket or prober-specific mounts
Find out more ⟶
Probe Card Stiffeners

Reinforce probe card assemblies to minimize deflection and maintain performance in thermally and mechanically demanding test environments.
- Maintains flatness across probe head footprint
- Built for temperature stability and mechanical load
- Available in aluminum or stainless steel options

